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- M. Samad, M. Shimizu, and Y. Hijikata
Demonstration of Quantum Polarized Microscopy using an Entangled-Photon Source
Photonics, Vol. 12, a.n. 127 (2025).
PDF DOI: 10.3390/photonics12020127
- M. Shimizu, K. Sugimoto, and Y. Hijikata
Thermoelectric measurements of nanomaterials by nanodiamond quantum thermometry
Appl. Phys. Express, Vol. 17, a.n. 095001 (2024).
PDF,suppl DOI: 10.35848/1882-0786/ad6fe9
- ìŒû@‘ñ^, ‘åÎ@—³Žk, ´…@–ƒŠó, “y•û@‘דl, ‘Šì@T–ç
Ar/N2¬‡•µˆÍ‹C’†RFƒ}ƒOƒlƒgƒƒ“ƒXƒpƒbƒ^ƒŠƒ“ƒO–@‚Å컂µ‚½ƒAƒ‚ƒ‹ƒtƒ@ƒXSnO2:N”––Œ‚Ì“Á«•]‰¿
“d‹CŠw‰ï˜_•¶ŽC, Vol.@144, pp. 1093-1099 (2024).
DOI: 10.1541/ieejeiss.144.1093
- S. Motoki, S.-i. Sato, S. Saiki, Y. Masuyama, Y. Yamazaki, T. Ohshima, K. Murata, H. Tsuchida, and Y. Hijikata
Optically Detected Magnetic Resonance of Silicon Vacancies in 4H-SiC at Elevated Temperatures toward Magnetic Sensing under Harsh Environments
J. Appl. Phys., Vol. 133, a.n. 154402 (2023)..
DOI: 10.1063/5.0139801
- M. Shimizu, M. Shugo, S. Mori, Y. Hijikata, and S. Aikawa
The influence of oxygen related defects on the formation of In2O3-based low fluorescence transparent conducting film
Phys. Status Solidi A, Vol. 220, a.n. 2200896 (2023).
PDF DOI: 10.1002/pssa.202200896
- T. Suzuki, Y. Yamazaki, T. Taniguchi, K. Watanabe, Y. Nishiya, Y.-i. Matsushita, K. Harii, Y. Masuyama, Y. Hijikata, and T. Ohshima
Spin property improvement of boron vacancy defect in hexagonal boron nitride by thermal treatment
Appl. Phys. Express, Vol. 16, a.n. 032006 (2023)..
DOI: 10.35848/1882-0786/acc442
- Y. Hijikata, S. Komori, S. Otojima, Y.-i. Matsushita, T. Ohshima
Impact of formation process on the radiation properties of single-photon sources generated on SiC crystal surfaces
Appl. Phys. Lett., Vol. 118, a.n. 204005 (2021).
PDF(2.2MB) DOI: 10.1063/5.0048772
- T. Narahara, S.-i. Sato, K. Kojima, Y. Hijikata, T. Ohshima
Influences of hydrogen ion irradiation on NCVSi- formation in 4H-Silicon Carbide
Appl. Phys. Express, Vol. 14, a.n. 021004 (2021).
DOI: 10.35848/1882-0786/abdc9e
- Y. Yamazaki, Y. Chiba, S.-I. Sato, T. Makino, N. Yamada, T. Satoh, K. Kojima, Y. Hijikata, H. Tsuchida, N. Hoshino, S.-Y. Lee, T. Ohshima
Carrier dynamics of silicon vacancies of SiC under simultaneous optically and electrically excitations
Appl. Phys. Lett., Vol. 118, a.n. 021106 (2021).
DOI: 10.1063/5.0028318
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((Invited)) Y. Hijikata
A SiC Single-Photon Emitting Device Embedded with the MOS Interface Color Centers
The 5th Asia-Pacific Conference on Silicon Carbide and Related Materials (APCSCRM) 2024 (Shenzhen, China) 2024.11.7.
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R. Oyama and Y. Hijikata
Polarization control of SiO2/SiC interfacial single-photon sources by oxygen pressure during thermal oxidation
International Conference on Silicon Carbide and Related Materials (ICSCRM) 2024 (Raleigh, USA) 2-P-41, 2024.10.2.
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((Invited)) Y. Hijikata
Density and polarization controls of the single photon sources formed at the MOS interface
The 4th Asia-Pacific Conference on Silicon Carbide and Related Materials (APCSCRM) 2023 (Beijing, China) 2023.11.10.
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((Invited)) Y. Hijikata
Characteristics of the single photon sources formed at the MOS interface
The 3rd Asia-Pacific Conference on Silicon Carbide and Related Materials (APCSCRM) 2022 (Xuzhou, China / Online) 2022.11.14-16.
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T. Suzuki, Y. Yamazaki, T. Taniguchi, K. Watanabe, Y.-I. Matsushita, Y. Nishiya, Y. Masuyama, Y. Hijikata, T Ohshima
Generation of boron vacancy defects in hexagonal boron nitride by high temperature ion irradiation
32nd International Conference on Diamond and Carbon Materials (ICDCM2022), (Lisbon, Portugal) O09B.1, 2022.9.6.
- S. Motoki, S.-I. Sato, Y. Masuyama, Y. Yamazaki, S. Saiki, Y. Hijikata, T. Ohshima
Magnetic Sensitivity of Silicon Vacancies in 4H-SiC at Different Temperatures
Defects in solids for quantum technologies (DSQT) (Stockholm, Sweden), 2022.6.16.
- S. Motoki, S.-I. Sato, Y. Masuyama, Y. Yamazaki, S. Saiki, Y. Hijikata, T. Ohshima
Optically detected magnetic resonance of silicon vacancies in 4H-SiC with different temperatures
4th International Forum on Quantum Metrology and Sensing (IFQMS) (Online) SE-03A-alpha2-05, 2021.12.8.
- T. suzuki, Y. Yamazaki, T. Taniguchi, K. Watanabe, Y.-I. Matsushita, Y. Masuyama, Y. Hijikata, T Ohshima
Thermal effects on generation of spin defects in hexagonal boron nitride
4th International Forum on Quantum Metrology and Sensing (IFQMS) (Online) SE-03A-beta1-07, 2021.12.8.
- K. Sugimoto, Y. Hijikata, M. Shimizu
Constructing a thermoelectric measurement system by using nitrogen|vacancy center in nanodiamonds
14th International Conference on New Diamond and Nano Cabons (NDNC) 2020/2021 (Online) 8A-20, 2021.6.8.
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- M. Samad, M. Shimizu, Y. Hijikata
Polarization-Sensitive Quantum Imaging Using an Entangled-Photon Source
‘æ72‰ñ‰ž—p•¨—Šw‰ït‹GŠwpu‰‰‰ï (14p-K508-3) (–ì“c/ƒIƒ“ƒ‰ƒCƒ“) 2025.3.14.
- •“¡ —²‘¾, jˆä ˆêÆ, ´… –ƒŠó, –Ø•H Š®‘¾, –îè Œ‹–ç, ‘Šì T–ç, ‘哇 •, “y•û ‘דl
ITO“§–¾“±“d–Œ‚É‚æ‚éSiC/SiO2ŠE–Ê’PˆêŒõŽqŒ¹‚Ì”Œõ‹“x§Œä
‘æ72‰ñ‰ž—p•¨—Šw‰ït‹GŠwpu‰‰‰ï (14p-K402-6) (–ì“c/ƒIƒ“ƒ‰ƒCƒ“) 2025.3.14.
- •“¡ —²‘¾, jˆä ˆêÆ, ´… –ƒŠó, –Ø•H Š®‘¾, ‘Šì T–ç, ‘哇 •, “y•û ‘דl
ITO“§–¾“±“d–Œ‚ð—p‚¢‚½SiC/SiO2ŠE–Ê’PˆêŒõŽqŒ¹‚Ì“dŠE§Œä
æiƒpƒ[”¼“±‘Ì•ª‰È‰ï‘æ11‰ñu‰‰‰ï (IB-17) (‚è) 2024.11.25.
- ŽRé GˆçC²“¡ ^ˆê˜YC‘º“c WˆêC‰Ô—Ö ‰ëŽjCŽRí• —YˆêC“y“c GˆêC“y•û ‘דlC‘哇 •
4H-SiC’†ƒVƒŠƒRƒ“‹óE‚ÌODMR“Á«‚ɑ΂·‚é13CŠjƒXƒsƒ“‚̉e‹¿
æiƒpƒ[”¼“±‘Ì•ª‰È‰ï‘æ11‰ñu‰‰‰ï (IB-18) (‚è) 2024.11.25.
- ‘åŽR@—Ï‹å, “y•û ‘דl
‚Ž_‘fˆ³”MŽ_‰»‚É‚æ‚éSiO2/SiCŠE–Ê’PˆêŒõŽqŒ¹‚̕Όõ§Œä
‘æ85‰ñ‰ž—p•¨—Šw‰ïH‹GŠwpu‰‰‰ï (18a-C41-7) (VŠƒ) 2024.9.18.
- ŽRé Gˆç, ²“¡ ^ˆê˜Y, ‘º“c Wˆê, ‰Ô—Ö ‰ëŽj, ’£ ·ž^, ŽRí• —Yˆê, “y“c Gˆê, “y•û ‘דl, ‘哇
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12C”Zk4H-SiC’†‚ÉŒ`¬‚µ‚½ƒVƒŠƒRƒ“‹óE‚ÌODMR“Á«
‘æ71‰ñ‰ž—p•¨—Šw‰ït‹GŠwpu‰‰‰ï (23a-52A-7) (¢“c’J/ƒIƒ“ƒ‰ƒCƒ“) 2024.3.23.
- ˜Z“c ‘å‹M, jˆä ˆêÆ, Qixian Liao, ’š _, D“c ½, “y•û ‘דl, ‘哇 •
4H-SiC‹y‚ÑSiO2ãPt/Co‹Ž¥«”––Œ‚ÌŽ¥‹CˆÙ•û«§Œä
‘æ71‰ñ‰ž—p•¨—Šw‰ït‹GŠwpu‰‰‰ï (25a-12F-7) (¢“c’J/ƒIƒ“ƒ‰ƒCƒ“) 2024.3.25.
- ìŒû ‘ñ^, ‘åÎ —³Žk, ´… –ƒŠó, “y•û ‘דl, ‘Šì T–ç
RFƒ}ƒOƒlƒgƒƒ“ƒXƒpƒbƒ^–@‚Å컂µ‚½SnO2:N”––Œ‚̃oƒ‹ƒN“àŽ_‘f‹óE’ጸ‚¨‚æ‚уoƒ‹ƒN“à‘g¬‚Ì•]‰¿
‘æ71‰ñ‰ž—p•¨—Šw‰ït‹GŠwpu‰‰‰ï (24p-P16-14) (¢“c’J/ƒIƒ“ƒ‰ƒCƒ“) 2024.3.24.
- ‘åÎ —³Žk, –Ø•H Š®‘¾, “y•û ‘דl, ”g‘½–ì –rŽq, –q–ì r°, ‘Šì T–ç, ´… –ƒŠó
’áŒuŒõ‹“x‚Ì“§–¾“±“d–Œ‚ð—p‚¢‚½NVƒZƒ“ƒ^‚Ì“d‰×§Œä
‘æ71‰ñ‰ž—p•¨—Šw‰ït‹GŠwpu‰‰‰ï (25a-P06-3) (¢“c’J/ƒIƒ“ƒ‰ƒCƒ“) 2024.3.25.
- ¬“‡ ãÄ‘¾, ŽRŒû ’qO, “y•û ‘דl, ΋´ KŽ¡, ´… –ƒŠó
ƒiƒmƒ_ƒCƒ„ƒ‚ƒ“ƒhNVƒZƒ“ƒ^‚É‚¨‚¯‚é”í–Œ‚̉e‹¿
‘æ71‰ñ‰ž—p•¨—Šw‰ït‹GŠwpu‰‰‰ï (24p-1BB-15) (¢“c’J/ƒIƒ“ƒ‰ƒCƒ“) 2024.3.24.
- ‘åŽR—Ï‹åC“y•û ‘דl
”MŽ_‰»Žž‚ÌŽ_‘fˆ³‚É‚æ‚éSiO2/SiCŠE–Ê’PˆêŒõŽqŒ¹‚̕Όõ§Œä
æiƒpƒ[”¼“±‘Ì•ª‰È‰ï‘æ10‰ñu‰‰‰ï (IB-10) (‹à‘ò) 2023.11.30.
- ’£ ·ž^, ²“¡ ^ˆê˜Y, ‘º“c Wˆê, ‰Ô—Ö ‰ëŽj, Œ³–Ø G, ’£ Œ[q, “y“c Gˆê, “y•û ‘דl, ‘哇
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“dŽqüƎ˂ɂæ‚èŒ`¬‚µ‚½4H-SiC’†ƒVƒŠƒRƒ“‹óE‚̉דdó‘Ԃƃh[ƒsƒ“ƒO”Z“x‚ÌŠÖŒW
‘æ70‰ñ‰ž—p•¨—Šw‰ït‹GŠwpu‰‰‰ï (15a-A301-1) (Žl’J/ƒIƒ“ƒ‰ƒCƒ“) 2023.3.15.
- ’£ Œ[q, ²“¡ ^ˆê˜Y, ‘º“c Wˆê, ‰Ô—Ö ‰ëŽj, Œ³–Ø G, ’£ ·ž^, “y“c Gˆê, “y•û ‘דl, ‘哇
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“dŽqüƎ˂ɂæ‚é 4H-SiC ’†’‚‘fE‹óE•¡‡Œ‡Š×‚Ì‚”Z“xŒ`¬
‘æ70‰ñ‰ž—p•¨—Šw‰ït‹GŠwpu‰‰‰ï (15a-A301-2) (Žl’J/ƒIƒ“ƒ‰ƒCƒ“) 2023.3.15.
- ™–{ Vô, “y•û ‘דl, ´… –ƒŠó
ƒiƒmƒ_ƒCƒ„ƒ‚ƒ“ƒh‰·“xƒZƒ“ƒT‚ð—p‚¢‚½ƒJ[ƒ{ƒ“ƒiƒmƒ`ƒ…[ƒu‚Ì”M“d‘ª’è
‘æ70‰ñ‰ž—p•¨—Šw‰ït‹GŠwpu‰‰‰ï (17a-A302-2) (Žl’J/ƒIƒ“ƒ‰ƒCƒ“) 2023.3.17.
- Œ³–Ø G, ²“¡ ^ˆê˜Y, ²”Œ ½ˆêC‘º“c WˆêC‘ŽR —Y‘¾, ŽRí• —Yˆê, “y•û ‘דl, ‘哇 •
‚ƒGƒlƒ‹ƒM[“dŽqüƎ˂ɂæ‚é4H-SiC’†ƒVƒŠƒRƒ“‹óE‚Ì‚”Z“xŒ`¬
‘æ83‰ñ‰ž—p•¨—Šw‰ïH‹GŠwpu‰‰‰ï (20a-C306-2) (å‘ä/ƒIƒ“ƒ‰ƒCƒ“) 2022.9.20.
- —é–Ø “N‘¾, ŽRè —Yˆê, ’JŒû ®, “nç² Œ«Ži, ¼‰º —Yˆê˜Y, ¼’J ˜Ð«, ‘ŽR —Y‘¾, “y•û ‘דl, ‘哇 •
‚‰·ƒCƒIƒ“Ǝ˂ɂæ‚éhBN’†ƒzƒE‘f‹óEŒ‡Š×Œ`¬
‘æ69‰ñ‰ž—p•¨—Šw‰ït‹GŠwpu‰‰‰ï (25p-E204-5) (‘Š–ÍŒ´/ƒIƒ“ƒ‰ƒCƒ“) 2022.3.25.
- Œ³–Ø G, ²“¡ ^ˆê˜Y, ‘ŽR —Y‘¾, ŽRí• —Yˆê, “y•û ‘דl, ‘哇 •
“dŽqüƎ˂ɂæ‚Á‚ÄŒ`¬‚µ‚½4H-SiC’†ƒVƒŠƒRƒ“‹óE‚Ì”Z“x’è—Ê
‘æ69‰ñ‰ž—p•¨—Šw‰ït‹GŠwpu‰‰‰ï (25a-E301-2) (‘Š–ÍŒ´/ƒIƒ“ƒ‰ƒCƒ“) 2022.3.25.
- ¼‰º ‘å‹L, ²“¡ ^ˆê˜Y, ‘哇 •, “y•û ‘דl
4H-SiC Œ‹»’†‚ÉŒ`¬‚³‚ꂽ’‚‘f‹óEƒZƒ“ƒ^‚̕Όõ“Á«
‘æ69‰ñ‰ž—p•¨—Šw‰ït‹GŠwpu‰‰‰ï (25a-E301-3) (‘Š–ÍŒ´/ƒIƒ“ƒ‰ƒCƒ“) 2022.3.25.
- ŽçŒì —‚, ´… –ƒŠó, “y•û ‘דl, ‘Šì T–ç, X s
’áŒuŒõ‹“x‚Ì“§–¾“±“d–Œ‚ÌŒ`¬
‘æ69‰ñ‰ž—p•¨—Šw‰ït‹GŠwpu‰‰‰ï (23p-P12-11) (‘Š–ÍŒ´/ƒIƒ“ƒ‰ƒCƒ“) 2022.3.23.
- ¬XãÄ‘¾C“y•û ‘דl
”MŽ_‰»‚µ‚½SiC”¼“±‘Ì•\–ʂɌ`¬‚·‚é’PˆêŒõŽqŒ¹‚̕Όõ“Á«
æiƒpƒ[”¼“±‘Ì•ª‰È‰ï‘æ8‰ñu‰‰‰ï (IB-4) (ƒIƒ“ƒ‰ƒCƒ“) 2021.12.9.
- —é–Ø “N‘¾CŽRè —YˆêC’JŒû ®C“nç² Œ«ŽiC¼‰º —Yˆê˜YCjˆä ˆêÆCš¢’J Žu˜YC‘ŽR —Y‘¾C“y•û ‘דlC‘哇 •
‚QŽŸŒ³”––Œh-BN‚̃Xƒsƒ“Œ‡Š×Œ`¬‹y‚Ñ‚»‚ÌŒõŠw“Á«‚Ì‘ª’è
‘æ82‰ñ‰ž—p•¨—Šw‰ïH‹GŠwpu‰‰‰ï (12a-S301-11) (ƒIƒ“ƒ‰ƒCƒ“) 2021.9.12.
- Œ³–Ø G, ²“¡ ^ˆê˜Y, ‘ŽR —Y‘¾, ŽRí• —Yˆê, “y•û ‘דl, ‘哇 •
4H-SiC’†ƒVƒŠƒRƒ“‹óE‚É‚¨‚¯‚éŒõŒŸoŽ¥‹C‹¤–ƒXƒyƒNƒgƒ‹‚̉·“xˆË‘¶«
‘æ82‰ñ‰ž—p•¨—Šw‰ïH‹GŠwpu‰‰‰ï (12a-N305-8) (ƒIƒ“ƒ‰ƒCƒ“) 2021.9.12.
- Žá—Ñ Œ’C•y‚ —SÆC“茴 ‘ñ^, ²“¡ ^ˆê˜YCŽ™“‡ˆê‘C‘哇 •, “y•û ‘דl
SiC Œ‹»’†’‚‘f‹óEƒZƒ“ƒ^‚Ì—ÊŽqó‘Ô‘ª’è
‘æ68‰ñ‰ž—p•¨—Šw‰ït‹GŠwpu‰‰‰ï (17a-P01-2) (ƒIƒ“ƒ‰ƒCƒ“) 2021.3.17.
’˜‘
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Y. Hijikata, Y.-I. Matsushita, and T. Ohshima
"SiC thermal oxidation process and MOS interface characterizations: From carrier transportation to single-photon source" (Chapter 8) in "Handbook of Silicon Carbide Materials and Devices"
Ed. Zhe C. Feng, Taylor & Francis, CRC (May 31, 2023).
www.routledge.com/9780367188269
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